Title :
Infrared and terahertz nanoscopy for dielectric imaging and near-field mapping of antennas and transmission-lines
Author :
Hillenbrand, Rainer
Author_Institution :
Nanoopt. Group, CIC nanoGUNE, Donostia, Spain
Abstract :
We demonstrate nanoscale resolved IR and THz imaging and spectroscopy by recording the elastically scattered light from the tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.
Keywords :
atomic force microscopy; image resolution; infrared imaging; infrared spectroscopy; light scattering; near-field scanning optical microscopy; submillimetre wave antennas; terahertz spectroscopy; terahertz wave imaging; antenna near-field mapping; atomic force microscope tip; dielectric imaging; elastically scattered light; electronic device characterization; infrared nanoscopy; nanoscale resolved IR imaging; nanoscale resolved IR spectroscopy; nanoscale resolved THz imaging; nanoscale resolved THz spectroscopy; photonic device characterization; s-SNOM; scattering-type scanning near-field optical microscopy; terahertz nanoscopy; transmission-line; Nanoscale devices; Optical imaging; Optical interferometry; Optical scattering; Optical surface waves; Surface topography; Surface waves;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
DOI :
10.1109/irmmw-THz.2011.6105045
