Infrared and terahertz nanoscopy for dielectric imaging and near-field mapping of antennas and transmission-lines

Author

Hillenbrand, Rainer

Author_Institution

Nanoopt. Group, CIC nanoGUNE, Donostia, Spain

fYear

2011

fDate

2-7 Oct. 2011

Firstpage

1

Lastpage

3

Abstract

We demonstrate nanoscale resolved IR and THz imaging and spectroscopy by recording the elastically scattered light from the tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.

Keywords

atomic force microscopy; image resolution; infrared imaging; infrared spectroscopy; light scattering; near-field scanning optical microscopy; submillimetre wave antennas; terahertz spectroscopy; terahertz wave imaging; antenna near-field mapping; atomic force microscope tip; dielectric imaging; elastically scattered light; electronic device characterization; infrared nanoscopy; nanoscale resolved IR imaging; nanoscale resolved IR spectroscopy; nanoscale resolved THz imaging; nanoscale resolved THz spectroscopy; photonic device characterization; s-SNOM; scattering-type scanning near-field optical microscopy; terahertz nanoscopy; transmission-line; Nanoscale devices; Optical imaging; Optical interferometry; Optical scattering; Optical surface waves; Surface topography; Surface waves;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on

Conference_Location

Houston, TX

ISSN

2162-2027

Print_ISBN

978-1-4577-0510-6

Electronic_ISBN

2162-2027

Type

conf

DOI

10.1109/irmmw-THz.2011.6105045

Filename

6105045