• DocumentCode
    2675088
  • Title

    Novel image quality metric based on similarity

  • Author

    Jin, Lina ; Ponomarenko, Nikolay ; Egiazarian, Karen

  • Author_Institution
    Dept. of Signal Process., Tampere Univ. of Technol., Tampere, Finland
  • fYear
    2011
  • fDate
    June 30 2011-July 1 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we present a novel approach to image quality metric taking into account degradation of contrast and brightness as well as block similarity. The metric is achieved by performing of the following steps: 1) reducing contrast and brightness in distorted image, 2) using block-matching (BM) to group similar 2D image fragments into 3D data arrays in original image and preprocessed distorted image separately, 3) analyzing of these blocks in DCT domain. The DCT coefficients differences are calculated between pixel values with contrast sensitivity function (CSF) and reduced by contrast masking according to Human Visual System (HVS). We validate the performance of our algorithms with five most popular quality image databases: TID, LIVE, CSIQ, IVC and Cornell-A57. The analysis of the results shows that the proposed quality metric provides better correlation to Mean Observer Score (MOS) than most of recent popular state-of-the-art metrics, e.g. MSSIM, SSIM. The average Spearman Correlation of proposed metric reaches 0.894.
  • Keywords
    discrete cosine transforms; image matching; quality control; 2D image fragments; 3D data arrays; CSIQ; Cornell-A57; DCT domain; IVC; LIVE; TID; block similarity; block-matching; contrast masking; contrast sensitivity function; human visual system; image brightness degradation; image contrast degradation; image databases; image quality metric; mean observer score; pixel values; preprocessed distorted image; spearman correlation; Correlation; Databases; Discrete cosine transforms; Humans; Image quality; Measurement; Transform coding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signals, Circuits and Systems (ISSCS), 2011 10th International Symposium on
  • Conference_Location
    lasi
  • Print_ISBN
    978-1-61284-944-7
  • Type

    conf

  • DOI
    10.1109/ISSCS.2011.5978673
  • Filename
    5978673