DocumentCode :
2675110
Title :
Extreme Ultraviolet Radiation from Z-pinch Plasmas for Next Generation Lithography
Author :
Akiyama, H. ; Katsuki, S. ; Namihira, T. ; Sakugawa, T. ; Imamura, H.
Author_Institution :
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto
fYear :
2006
fDate :
14-18 May 2006
Firstpage :
356
Lastpage :
359
Abstract :
Development of the high power EUV (extreme ultraviolet) source has been expected as a light source for the next generation lithography. There are two kinds of EUV sources: the discharge produced plasma (DPP) and the laser produced plasma (LPP). The DPP method is considered to be promising in easiness of radiating the high power EUV and in the cheapness of constructing the EUV source. The Z- pinch plasmas driven by pulsed power have been used mainly in the DPP method. Here, the research results of the DPP method at Kumamoto University are summarized.
Keywords :
Z pinch; discharges (electric); lithography; plasma production by laser; plasma sources; discharge-produced plasma; extreme ultraviolet radiation; laser-produced plasma; light source; lithography; z-pinch plasmas; Electron tubes; Fault location; Lithography; Magnetic field measurement; Plasma density; Plasma sources; Plasma temperature; Plasma waves; Ultraviolet sources; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator Symposium, 2006. Conference Record of the 2006 Twenty-Seventh International
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0018-X
Electronic_ISBN :
1-4244-0019-8
Type :
conf
DOI :
10.1109/MODSYM.2006.365258
Filename :
4216210
Link To Document :
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