Title :
On the Generation of Weights for Weighted Pseudo Random Testing
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
University of Iowa
Keywords :
Cities and towns; Contracts; Costs; Fault detection; Flip-flops; Hardware; Random sequences; Test pattern generators; Testing;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669641
