DocumentCode :
2675294
Title :
Investigation of recombination of nonequilibrium charge carriers in InAs
Author :
Kesler, Valeriy G. ; Gorbunov, Andrei V.
Author_Institution :
Inst. of Semicond. Phys. SB RAS, Novosibirsk, Russia
fYear :
2009
fDate :
1-6 July 2009
Firstpage :
17
Lastpage :
19
Abstract :
This work is devoted to the development of method for determination of life time and surface recombination rate in epitaxial layers of indium arsenide. The determination of relaxation parameters is based on modeling of nonequilibrium charge carriers recombination process under pulse laser exposure of semiconductor film surface and comparison of simulated and experimental curves of photoconductivity relaxation. The experimental photoconductivity relaxation curves were obtained by microwave (SHF) method.
Keywords :
III-V semiconductors; carrier lifetime; indium compounds; laser beam effects; photoconductivity; semiconductor epitaxial layers; surface recombination; InAs; carrier life time; epitaxial layers; microwave method; nonequilibrium charge carrier recombination; photoconductivity relaxation parameters; pulse laser exposure; semiconductor film surface; surface recombination rate; Charge carriers; Epitaxial layers; Indium; Laser modes; Masers; Optical pulses; Photoconductivity; Radiative recombination; Semiconductor lasers; Semiconductor process modeling; InAs; microwave; surface recombination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro/Nanotechnologies and Electron Devices, 2009. EDM 2009. International Conference and Seminar on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4244-4571-4
Type :
conf
DOI :
10.1109/EDM.2009.5173915
Filename :
5173915
Link To Document :
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