Title :
Exploitation Of Parallelism In Vlsi Array Testing
Author_Institution :
University of Minnesota
Keywords :
Broadcasting; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Parallel processing; Signal processing algorithms; Switches; System testing; Very large scale integration;
Conference_Titel :
Signals, Systems and Computers, 1988. Twenty-Second Asilomar Conference on
DOI :
10.1109/ACSSC.1988.754673
