Title :
Research and device simulation of substrate noise distribution in digital integrated elements
Author :
Krupkina, Tatyana Y. ; Rodionov, Denis V.
Author_Institution :
Moscow Inst. of Electron. Technol. (Tech. Univ.), Moscow, Russia
Abstract :
In this paper aspects of device simulation of digital elements have been reviewed. Theoretical and practical aspects of noise modeling in integrated circuits substrate have been discussed.
Keywords :
digital integrated circuits; integrated circuit modelling; integrated circuit noise; digital element device simulation; integrated circuit noise modeling; integrated circuit substrate noise distribution; Analog integrated circuits; Circuit noise; Circuit simulation; Digital integrated circuits; Electronics industry; Integrated circuit modeling; Integrated circuit noise; Integrated circuit technology; Semiconductor device noise; Substrates; Device simulation; integrated circuits; noise in substrate;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices, 2009. EDM 2009. International Conference and Seminar on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4244-4571-4
DOI :
10.1109/EDM.2009.5173918
