Development of Seebeck coefficient measurement system with wide range of temperatures for inorganic material measurement

Author

Lulu Zhang ; Xing Chen ; Jianhai Sun ; Haoyuan Cai ; Hui Li ; Dafu Cui

Author_Institution

State Key Lab. of Transducer Technol., Inst. of Electron., Beijing, China

fYear

2015

fDate

7-9 April 2015

Firstpage

1

Lastpage

4

Abstract

Seebeck coefficient of material is a key parameter in thermoelectric characteristics research. In this paper, a precise Seebeck coefficient measurement system with wide range of temperatures from -100°C to 150°C was developed. The Seebeck coefficient of metallic Ni was evaluated at different temperatures which show similar results. The system was able to measure the Seebeck coefficient of inorganic thin film material which resistance is over 1.65×10⁸Ω. The measurement repeatability of the Seebeck coefficient was also evaluated.

Keywords

Seebeck effect; metallic thin films; nickel; Ni; inorganic material measurement; inorganic thin film material; measurement repeatability; seebeck coefficient measurement system; temperature -100 degC to 150 degC; thermoelectric characteristics; Computers; Heating; Instruments; Nickel; Seebeck coefficient; linear fitting curve; pulse tube refrigerator; thermoelectric effect;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Sensors, Sensor Networks and Information Processing (ISSNIP), 2015 IEEE Tenth International Conference on

Conference_Location

Singapore

Print_ISBN

978-1-4799-8054-3

Type

conf

DOI

10.1109/ISSNIP.2015.7106940

Filename

7106940