Title :
Development of Seebeck coefficient measurement system with wide range of temperatures for inorganic material measurement
Author :
Lulu Zhang ; Xing Chen ; Jianhai Sun ; Haoyuan Cai ; Hui Li ; Dafu Cui
Author_Institution :
State Key Lab. of Transducer Technol., Inst. of Electron., Beijing, China
Abstract :
Seebeck coefficient of material is a key parameter in thermoelectric characteristics research. In this paper, a precise Seebeck coefficient measurement system with wide range of temperatures from -100°C to 150°C was developed. The Seebeck coefficient of metallic Ni was evaluated at different temperatures which show similar results. The system was able to measure the Seebeck coefficient of inorganic thin film material which resistance is over 1.65×108Ω. The measurement repeatability of the Seebeck coefficient was also evaluated.
Keywords :
Seebeck effect; metallic thin films; nickel; Ni; inorganic material measurement; inorganic thin film material; measurement repeatability; seebeck coefficient measurement system; temperature -100 degC to 150 degC; thermoelectric characteristics; Computers; Heating; Instruments; Nickel; Seebeck coefficient; linear fitting curve; pulse tube refrigerator; thermoelectric effect;
Conference_Titel :
Intelligent Sensors, Sensor Networks and Information Processing (ISSNIP), 2015 IEEE Tenth International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-8054-3
DOI :
10.1109/ISSNIP.2015.7106940
