Title :
How to Treat the Reliability of Defect Detection and Assessment in Nondestructive Testing?
Author :
Nockemann, C. ; Tillack, G.-R. ; Bellon, C. ; Johannsen, K. ; Heine, S.
Author_Institution :
BAM Berlin, Federal Institute of Materials Research and Testing
Keywords :
Computer network reliability; Diagnostic radiography; Inspection; Materials testing; Medical tests; Nondestructive testing; Probability; Signal detection; System testing; Welding;
Conference_Titel :
Statistical Signal and Array Processing., IEEE Seventh SP Workshop on
DOI :
10.1109/SSAP.1994.572540
