Motion controller for the Atomic Force Microscopy based nanomanipulation system

Nanomanipulation with Atomic force microscopy (AFM) is one of the fundamental tools for nano-manufacturing. The control of the nanomanipulation system requires accurate feedback from the piezoelectric actuator and high frequency response of the control system. We designed and implemented two distinct control schemes by using real-time Linux. The aim is to study various factors in the control of the AFM based nanomanipulation system. By integrating the original controller with the external Linux real-time controller, we achieved a stable system with high response frequency. Finally this multiple input single output (MISO) system is validated to be an effective and efficient tool for the controlling of the nanolithography operation through a haptic device.