DocumentCode
2676412
Title
Built-in self-reconfiguring systems for mesh-connected processor arrays with spares on two rows/columns
Author
Takanami, Itsuo
Author_Institution
Ichinoseki Nat. Coll. of Technol., Iwate, Japan
fYear
2000
fDate
2000
Firstpage
213
Lastpage
221
Abstract
The author discusses some reconfiguration methods where faulty PEs are compensated for by spare PEs located in two rows/columns in/around a mesh-connected array since they have the advantages that the numbers of spare PEs and the network overheads for reconstructions are relatively small. First, the author discusses how arrangements of spare PEs and network architectures affect the efficiencies of reconfigurations. As arrangements of spare PEs, he considers the cases where either spare linear arrays face each other or are located orthogonally. As replacements of faulty PEs by spare PEs, straight shifts using double or single tracks are considered. Reconfiguration algorithms are given for the proposed methods. The efficiencies of reconfigurations for the methods, that is, the reconfiguration probabilities, are compared with each other. Finally, the author presents built-in self-reconfiguring systems for the proposed methods by hardware. This implies that the proposed methods are effective in enhancing the run-time reliabilities as well as the fabrication-time yields of the processor arrays
Keywords
VLSI; fault tolerant computing; integrated circuit reliability; microprocessor chips; parallel architectures; probability; reconfigurable architectures; redundancy; built-in self-reconfiguring systems; fabrication-time yields; faulty PEs; mesh-connected processor arrays; network architectures; opposite spare scheme; orthogonal spare scheme; reconfiguration algorithms; reconfiguration methods; reconfiguration probabilities; run-time reliabilities; spare PEs; spare processing elements; Concurrent computing; Educational institutions; Hardware; Image processing; Image reconstruction; Runtime; Signal processing; Switches; Very large scale integration; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
Conference_Location
Yamanashi
ISSN
1550-5774
Print_ISBN
0-7695-0719-0
Type
conf
DOI
10.1109/DFTVS.2000.887159
Filename
887159
Link To Document