• DocumentCode
    2676412
  • Title

    Built-in self-reconfiguring systems for mesh-connected processor arrays with spares on two rows/columns

  • Author

    Takanami, Itsuo

  • Author_Institution
    Ichinoseki Nat. Coll. of Technol., Iwate, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    213
  • Lastpage
    221
  • Abstract
    The author discusses some reconfiguration methods where faulty PEs are compensated for by spare PEs located in two rows/columns in/around a mesh-connected array since they have the advantages that the numbers of spare PEs and the network overheads for reconstructions are relatively small. First, the author discusses how arrangements of spare PEs and network architectures affect the efficiencies of reconfigurations. As arrangements of spare PEs, he considers the cases where either spare linear arrays face each other or are located orthogonally. As replacements of faulty PEs by spare PEs, straight shifts using double or single tracks are considered. Reconfiguration algorithms are given for the proposed methods. The efficiencies of reconfigurations for the methods, that is, the reconfiguration probabilities, are compared with each other. Finally, the author presents built-in self-reconfiguring systems for the proposed methods by hardware. This implies that the proposed methods are effective in enhancing the run-time reliabilities as well as the fabrication-time yields of the processor arrays
  • Keywords
    VLSI; fault tolerant computing; integrated circuit reliability; microprocessor chips; parallel architectures; probability; reconfigurable architectures; redundancy; built-in self-reconfiguring systems; fabrication-time yields; faulty PEs; mesh-connected processor arrays; network architectures; opposite spare scheme; orthogonal spare scheme; reconfiguration algorithms; reconfiguration methods; reconfiguration probabilities; run-time reliabilities; spare PEs; spare processing elements; Concurrent computing; Educational institutions; Hardware; Image processing; Image reconstruction; Runtime; Signal processing; Switches; Very large scale integration; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887159
  • Filename
    887159