• DocumentCode
    2676466
  • Title

    Self-repairing in a micro-programmed processor for dependable applications

  • Author

    Benso, Alfredo ; Chiusano, Silvia ; Prinetto, P. ; Simonotti, P. ; Ugo, G.

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    231
  • Lastpage
    239
  • Abstract
    This paper presents the on-going activities on the design of a Built-In-Self-Repairable micro-processor for high dependable environments. The processor, designed to perform SISD instructions, is able to on-line dynamically reconfigure its internal micro-code in order to “emulate” faulty functional blocks using fault-free blocks of the system only. one of the main novelties of our approach is therefore that no redundant or spare computational blocks are added to the system to allow self-repairing. The approach is completely transparent to the user, and allows a graceful degradation of the device, which is able to complete the requested operations even in presence of multiple faults in its functional units
  • Keywords
    built-in self test; fault tolerant computing; integrated circuit design; microprocessor chips; SISD instructions; built-in-self-repairable microprocessor; dependable applications; fault-free blocks; faulty functional blocks; functional units; internal micro-code; micro-programmed processor; multiple faults; Biomedical monitoring; Computer architecture; Condition monitoring; Degradation; Planets; Process design; Radioactive pollution; Solar system; Space missions; Surveillance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887161
  • Filename
    887161