DocumentCode
2676466
Title
Self-repairing in a micro-programmed processor for dependable applications
Author
Benso, Alfredo ; Chiusano, Silvia ; Prinetto, P. ; Simonotti, P. ; Ugo, G.
Author_Institution
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
fYear
2000
fDate
2000
Firstpage
231
Lastpage
239
Abstract
This paper presents the on-going activities on the design of a Built-In-Self-Repairable micro-processor for high dependable environments. The processor, designed to perform SISD instructions, is able to on-line dynamically reconfigure its internal micro-code in order to “emulate” faulty functional blocks using fault-free blocks of the system only. one of the main novelties of our approach is therefore that no redundant or spare computational blocks are added to the system to allow self-repairing. The approach is completely transparent to the user, and allows a graceful degradation of the device, which is able to complete the requested operations even in presence of multiple faults in its functional units
Keywords
built-in self test; fault tolerant computing; integrated circuit design; microprocessor chips; SISD instructions; built-in-self-repairable microprocessor; dependable applications; fault-free blocks; faulty functional blocks; functional units; internal micro-code; micro-programmed processor; multiple faults; Biomedical monitoring; Computer architecture; Condition monitoring; Degradation; Planets; Process design; Radioactive pollution; Solar system; Space missions; Surveillance;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
Conference_Location
Yamanashi
ISSN
1550-5774
Print_ISBN
0-7695-0719-0
Type
conf
DOI
10.1109/DFTVS.2000.887161
Filename
887161
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