DocumentCode :
2676610
Title :
A DC-10.5-GHz CMOS Distributed Amplifier with 3.2±0.3 dB NF, 10.5±1.4 dB Gain and ±13.8 ps Group Delay Variation
Author :
Chang, Jin-Fa ; Lin, Yo-Sheng
Author_Institution :
Dept. of Electr. Eng., Nat. Chi Nan Univ., Puli, Taiwan
fYear :
2011
fDate :
16-19 Jan. 2011
Firstpage :
307
Lastpage :
310
Abstract :
A DC-10.5-GHz CMOS distributed amplifier (DA) with flat and low noise figure (NF), flat and high power gain (S21), and small group delay variation using standard 0.18 μm CMOS technology is demonstrated. Flat and low NF was achieved by adopting the proposed RLC terminal network with 140 Ω terminal resistance at dc and very high frequencies (instead of the traditional 50 Ω terminal resistance or the recently proposed RL terminal network) for the gate transmission line, and a slightly under-damped Q-factor for the second-order NF frequency response. Besides, flat and high S21 was achieved by using cascoded transistors as the gain cell. Over the DC-10.5-GHz band, the DA consumed 29.16 mW and achieved flat and high S21 of 10.5±1.4 dB, flat and low NF of 3.2±0.3 dB, and excellent phase linearity (the group delay variation was only ±13.8 ps), one of the best NF and phase linearity results ever reported for a CMOS DA or wideband LNA with bandwidth greater 7.5 GHz.
Keywords :
CMOS analogue integrated circuits; Q-factor; distributed amplifiers; microwave amplifiers; microwave integrated circuits; CMOS distributed amplifier; cascoded transistors; flat noise figure; frequency 10.5 GHz; gate transmission line; group delay variation; low noise figure; power 29.16 mW; resistance 140 ohm; second-order NF frequency response; size 0.18 mum; slightly under-damped Q-factor; time -13.8 ps; time 13.8 ps; CMOS integrated circuits; Frequency measurement; Gain; Logic gates; Noise measurement; Resistance; Semiconductor device modeling; CMOS; NF; distributed amplifier; gain; group delay variation; low-noise amplifier;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio and Wireless Symposium (RWS), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-7687-9
Type :
conf
DOI :
10.1109/RWS.2011.5725429
Filename :
5725429
Link To Document :
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