Title :
Analysis of Trapped Image Guides Using Effective Dielectric Constants and Surface Impedances
Author :
Zhou, W.B. ; Itoh, T.
Abstract :
Trapped image guides are analyzed using a new method. The results agree much better with experimental data than those previously derived from a simple effective dielectric constant approach.
Keywords :
Dielectric constant; Dielectric losses; Distributed parameter circuits; Equations; Image analysis; Millimeter wave integrated circuits; Millimeter wave technology; Region 5; Resonance; Surface impedance;
Conference_Titel :
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location :
Dallas, TX, USA
DOI :
10.1109/MWSYM.1982.1130696
