Title :
S-parameters extraction for wide-band transition from coupled microstrip line to waveguide by the LRdR method
Author :
Tong, Ziqiang ; Stelzer, Andreas
Author_Institution :
Inst. for Commun. Eng. & RF-Syst., J.K. Univ., Austria
Abstract :
This paper presents a practical method for extracting the S-parameters of a transition from a coupled microstrip line to a rectangular waveguide. By utilizing three standards (load, reflect, delayed reflect) for the waveguide port, the S-parameters (in both differential and common modes) of the transition can be calculated. A wide-band transition was tested to validate the calculation, and the results were in good agreement with expectations. This method is generic in the sense that it is suitable for other kinds of transitions, for instance, coplanar waveguide to waveguide, or coaxial line to waveguide, etc.
Keywords :
S-parameters; coaxial cables; coplanar waveguides; coupled transmission lines; microstrip lines; rectangular waveguides; LRdR method; S-parameters extraction; coaxial line; common modes; coplanar waveguide; coupled microstrip line; differential modes; rectangular waveguide; waveguide port; wide-band transition; Insertion loss; Loss measurement; Microstrip; Reflection; Scattering parameters; Standards; Waveguide transitions; Microstrip; rectangular waveguide; scattering parameters; transition; wide band;
Conference_Titel :
Radio and Wireless Symposium (RWS), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4244-7687-9
DOI :
10.1109/RWS.2011.5725451