DocumentCode :
2677025
Title :
A Programmable Load for Power and Noise Characterization
Author :
Leake, B.W.
fYear :
1982
fDate :
15-17 June 1982
Firstpage :
348
Lastpage :
350
Abstract :
A digitally-controlled one-port tuner, providing sixty-four distinct impedances, has been used to examine the relationship between nonlinear power transistor performance and load impedance. In a similar way, the noise parameters of low noise linear transistors have been deduced from measurements using the tuner to control source impedance. All control, measurement and data reduction functions are performed with a desktop computer.
Keywords :
Equations; Frequency; Impedance; Noise figure; Noise measurement; Power measurement; Power transistors; Pulse measurements; Reflection; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location :
Dallas, TX, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1982.1130715
Filename :
1130715
Link To Document :
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