Title :
Table of contents
Abstract :
The following topics are dealt with: integrated circuit manufacture; JTAG and hardware-software codesign; integrated circuit reliability; mixed signal design and testing; nonvolatile memories; analog, RF and digital design; formal verification, reliability and security; test generation and synthesis; and arithmetic FPGA implementation.
Keywords :
automatic test pattern generation; digital arithmetic; field programmable gate arrays; hardware-software codesign; integrated circuit design; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; random-access storage; JTAG; RF design; arithmetic FPGA implementation; digital design; formal verification; hardware-software codesign; integrated circuit manufacture; integrated circuit reliability; integrated circuit security; mixed signal design; mixed-signal testing; nonvolatile memories; test generation;
Conference_Titel :
Design & Test Symposium (IDT), 2014 9th International
Conference_Location :
Algiers
DOI :
10.1109/IDT.2014.7038575
