DocumentCode :
2677102
Title :
Electrical contact phenomena of nickel electrodeposits with sharp micro-asperities
Author :
Law, H.H. ; Holden, C.A. ; Sapjeta, J. ; Crane, G.R. ; Nakahara, S.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1990
fDate :
20-24 Aug 1990
Firstpage :
651
Lastpage :
659
Abstract :
The electrical contact phenomena of gray nickel deposits with unique surface asperities are studied. An insulating oxide layer is assumed to exist because there is no evidence to support its absence. Since the oxide film is known to be as strong as the metal and it scarcely ruptures at contact, the emphasis is to determine which particular surface features contribute to low values of contact resistance, especially after the coating is exposed to humidity testing. Reflection electron micrographs showed that the nickel coatings with low Rc after humidity exposure have sharp asperities on the surface. The oxide layer of these surfaces is shown not to be tenacious since the film resistivity depends strongly on the contact force. These sharp micro-asperities appear to account for the low R c behavior of gray coatings, as they disrupt the insulating film upon mechanical contact to create many small breaks in the oxide layer. Electrical contact then occurs through these breaks. At a load of 39 g or higher, the oxide is ruptured and the Rc is reduced to a low, stable value with or without exposure to an accelerated oxidizing environment
Keywords :
contact resistance; electrical contacts; electrodeposits; humidity; nickel alloys; phosphorus alloys; NiP electrodeposits; contact materials; contact resistance; electrical contact phenomena; humidity testing; insulating oxide layer; oxide film; sharp asperities; sharp micro-asperities; surface asperities; surface features; Coatings; Contact resistance; Electrons; Humidity; Insulation; Nickel; Optical films; Reflection; Surface resistance; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location :
Montreal, Que.
Type :
conf
DOI :
10.1109/HOLM.1990.113072
Filename :
113072
Link To Document :
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