RF filter characterization using a chirp

Historically test engineers have had the problem that during debug of initial silicon that they are asked to characterize certain parts of the device. This adds time pressure as this is never part of the test quotation which also adds cost pressure since this takes extra test time and tester time to develop. The following topic will discuss a simple to develop method that will characterize a filter using a chirp to sweep the filters´ frequency range. The Digital Signal Processing (DSP) behind this will also be covered.