Title :
iJTAG integration of complex digital embedded instruments
Author :
Ibrahim, Ahmed ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Test of Integrated Syst. Group, Univ. of Twente, Enschede, Netherlands
Abstract :
Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.
Keywords :
IEEE standards; automatic test pattern generation; embedded systems; multiprocessing systems; system-on-chip; IEEE 1149.1 TAP port; IEEE 1687; IEEE approved draft standard; MPSoC dependability management solution; complex digital embedded instruments; embedded instruments access; embedded instruments control; iJTAG control; modern SoC; Instruments; Organizations; Ports (Computers); Standards organizations; Synchronization; System-on-chip; Embedded Instruments; IEEE 1687; iJTAG;
Conference_Titel :
Design & Test Symposium (IDT), 2014 9th International
Conference_Location :
Algiers
DOI :
10.1109/IDT.2014.7038580