Title :
A UVM-based smart functional verification platform: Concepts, pros, cons, and opportunities
Author_Institution :
Mentor Graphics, Cairo, Egypt
Abstract :
SoC Verification is one of the hot issues in VLSI. More than 70 percent of the time is spent on verification. So, there is a need for constructing a reusable and robust verification environment. Universal verification methodology (UVM) is a promising solution to address these needs. This paper presents a survey on the features of UVM. It presents its pros, cons, and opportunities. Moreover, it presents simple steps to verify an IP and build an efficient verification environment. A SoC case study is presented to compare traditional verification with UVM-based verification.
Keywords :
VLSI; system-on-chip; IP; SoC; UVM; VLSI; smart functional verification platform; universal verification methodology; Hardware design languages; Libraries; Monitoring; Registers; System-on-chip; Time-domain analysis; Time-varying systems; Driver; IP; Monitor; OOP; Sequence; SoC; SystemVerilog; TLM; Test; UVM; Verification;
Conference_Titel :
Design & Test Symposium (IDT), 2014 9th International
Conference_Location :
Algiers
DOI :
10.1109/IDT.2014.7038594