• DocumentCode
    2677711
  • Title

    Study on stability of strapdown seeker scale factor error parasitical loop

  • Author

    Du, Yun-Li ; Xia, Qun-Li ; Guo, Tao

  • Author_Institution
    Sch. of Aerosp. Eng., Beijing Inst. of Technol., Beijing, China
  • Volume
    6
  • fYear
    2010
  • fDate
    24-26 Aug. 2010
  • Firstpage
    55
  • Lastpage
    58
  • Abstract
    Strapdown seeker scale factor error will degrade the performance of the seeker. In order to analyze the effect of seeker scale error on parasitical loop stability and effective navigation ratio, in this paper the strapdown seeker scale factor error is analyzed and the model of the scale factor error is constructed, meanwhile the concept of the strapdown seeker scale factor error parasitical loop is presented. The effect of the scale factor error on the navigation ratio is analyzed and the plot of normalized effective ratio versus the equivalent scale factor error is given. Finally the stability of the strapdown seeker scale factor error parasitical loop is analyzed by employing the normalization method and Routh criteria. The critical stable boundary of the parasitical loop is obtained through digital simulation. The simulation results give the relationships between turning rate time constant Ta, guidance time constant Tg and the strapdown seeker scale factor error when the system is critical stable. Those research results are instructive to the missiles guidance engineers during the primary scheme design period.
  • Keywords
    closed loop systems; missile guidance; stability; Routh criteria; critical stable boundary; digital simulation; normalization method; parasitical loop; stability; strapdown seeker scale factor error; Detectors; Navigation; parasiticale loop; scale factor error; stability; strapdown seekers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer, Mechatronics, Control and Electronic Engineering (CMCE), 2010 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4244-7957-3
  • Type

    conf

  • DOI
    10.1109/CMCE.2010.5609905
  • Filename
    5609905