Title :
Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052)
Abstract :
The following topics were dealt with: sensors; materials; manufacturing technology; SAW devices; BAW devices; cryogenic devices; microwave devices; frequency control circuitry; noise; atomic standards; time and frequency standards
Keywords :
atomic clocks; bulk acoustic wave devices; cryogenics; frequency control; frequency standards; microwave devices; sensors; surface acoustic wave devices; BAW devices; SAW devices; atomic standards; cryogenic devices; frequency control circuitry; frequency standards; manufacturing technology; materials; microwave devices; noise; sensors; time standards;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO, USA
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887321
