• DocumentCode
    2678481
  • Title

    Properties of Silicon Carbide nanotubes formed via reaction of SiO powder with SWCNTs and MWCNTs

  • Author

    Tan, William ; Hunley, Patrick ; Omer, Ingrid St

  • Author_Institution
    Syracuse Univ., Syracuse, NY, USA
  • fYear
    2009
  • fDate
    5-8 March 2009
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    Experiments to synthesize Silicon Carbide (SiC) nanotubes using single walled carbon nanotubes (SWCNTs) and multi-walled carbon nanotubes (MWCNTs) were preformed. Several experiments were conducted under vacuum in a high-temperature furnace varying temperature (1300degC-1450degC) and time. The optimal factors in synthesizing SiC nanostructures with MWCNTs were setting the dwell time to 6 hrs at 1450degC. While the optimal factor with SWCNTs was setting the dwell time to 30 mins at 1450degC. In general, samples were calcinated for 30 mins in 750degC. In both experiments, X-ray diffraction (XRD) patterns indicate our predominant polytype of SiC formed was 3C-SiC. Transmission electron microscopy (TEM) of our 6 hr experiment shows SiC nanostructures with polycrystalline layers and exhibiting a unique disk stacking structure. Scanning electron microscopy (SEM) of our 30 min experiment show fibrous and long nanotubes in which TEM and energy dispersive spectroscopy (EDS) indicate to be grains of SiC.
  • Keywords
    X-ray diffraction; calcination; nanotubes; scanning electron microscopy; silicon compounds; transmission electron microscopy; SiC; X-ray diffraction; energy dispersive spectroscopy; polycrystalline layers; scanning electron microscopy; single walled carbon nanotubes; temperature 1450 degC; temperature 750 degC; time 30 min; time 6 hour; transmission electron microscopy; Carbon nanotubes; Furnaces; Nanostructures; Powders; Scanning electron microscopy; Silicon carbide; Temperature; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2009. SOUTHEASTCON '09. IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-3976-8
  • Electronic_ISBN
    978-1-4244-3978-2
  • Type

    conf

  • DOI
    10.1109/SECON.2009.5174082
  • Filename
    5174082