DocumentCode :
2678600
Title :
Experimental and analytical study on the flow of encapsulant during underfill encapsulation of flip-chips
Author :
Han, Sejin ; Wang, K.K. ; Cho, Sung-Yong
Author_Institution :
Sibley Sch. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
1996
fDate :
28-31 May 1996
Firstpage :
327
Lastpage :
334
Abstract :
In this paper, the flow of encapsulant during the underfill encapsulation of flip-chips has been studied theoretically and experimentally. Analytical as well as numerical methods have been developed to analyze the flow during the underfill encapsulation process. For capillary-driven encapsulation, the capillary force at the melt-front has been calculated based on a model for the melt-front shape. A model has also been developed for the analysis of forced-injection encapsulation. The numerical analysis uses a finite-element method based on a generalized Hele-Shaw method to solve for the flow field. Experiments have been performed to investigate the flow behaviour during underfill encapsulation using actual chips and encapsulants. Short-shot experiments have been performed to look at the melt-front at different flow times. Experiments have also been performed to measure the material properties of the encapsulant, namely its viscosity, curing kinetics and surface-tension coefficient. The viscosity has been determined using an oscillatory parallel-plate-type viscometer and the curing kinetics via a differential scanning calorimetry. The experimental and simulation results are compared in terms of the flow-front shape after different flow times. Such comparisons indicate that the approximate model developed in this study is adequate to approximately simulate the flow during encapsulation of flip-chips
Keywords :
calorimetry; capillarity; encapsulation; finite element analysis; flip-chip devices; integrated circuit packaging; surface tension; viscosity; capillary-driven encapsulation; curing kinetics; differential scanning calorimetry; encapsulant flow; finite-element method; flip-chips; flow-front shape; forced-injection encapsulation; generalized Hele-Shaw method; melt-front shape; oscillatory parallel-plate-type viscometer; short-shot experiments; surface-tension coefficient; underfill encapsulation; viscosity; Curing; Encapsulation; Finite element methods; Kinetic theory; Material properties; Numerical analysis; Performance evaluation; Semiconductor device measurement; Shape; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-3286-5
Type :
conf
DOI :
10.1109/ECTC.1996.517409
Filename :
517409
Link To Document :
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