• DocumentCode
    2678600
  • Title

    Experimental and analytical study on the flow of encapsulant during underfill encapsulation of flip-chips

  • Author

    Han, Sejin ; Wang, K.K. ; Cho, Sung-Yong

  • Author_Institution
    Sibley Sch. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    327
  • Lastpage
    334
  • Abstract
    In this paper, the flow of encapsulant during the underfill encapsulation of flip-chips has been studied theoretically and experimentally. Analytical as well as numerical methods have been developed to analyze the flow during the underfill encapsulation process. For capillary-driven encapsulation, the capillary force at the melt-front has been calculated based on a model for the melt-front shape. A model has also been developed for the analysis of forced-injection encapsulation. The numerical analysis uses a finite-element method based on a generalized Hele-Shaw method to solve for the flow field. Experiments have been performed to investigate the flow behaviour during underfill encapsulation using actual chips and encapsulants. Short-shot experiments have been performed to look at the melt-front at different flow times. Experiments have also been performed to measure the material properties of the encapsulant, namely its viscosity, curing kinetics and surface-tension coefficient. The viscosity has been determined using an oscillatory parallel-plate-type viscometer and the curing kinetics via a differential scanning calorimetry. The experimental and simulation results are compared in terms of the flow-front shape after different flow times. Such comparisons indicate that the approximate model developed in this study is adequate to approximately simulate the flow during encapsulation of flip-chips
  • Keywords
    calorimetry; capillarity; encapsulation; finite element analysis; flip-chip devices; integrated circuit packaging; surface tension; viscosity; capillary-driven encapsulation; curing kinetics; differential scanning calorimetry; encapsulant flow; finite-element method; flip-chips; flow-front shape; forced-injection encapsulation; generalized Hele-Shaw method; melt-front shape; oscillatory parallel-plate-type viscometer; short-shot experiments; surface-tension coefficient; underfill encapsulation; viscosity; Curing; Encapsulation; Finite element methods; Kinetic theory; Material properties; Numerical analysis; Performance evaluation; Semiconductor device measurement; Shape; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.517409
  • Filename
    517409