• DocumentCode
    2678716
  • Title

    New researches on low noise signal generation based upon electronic devices with strong surface sensitivity

  • Author

    Enguang, Dai

  • Author_Institution
    Dept. of Electron., Beijing Univ., China
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    321
  • Lastpage
    327
  • Abstract
    The surface molecular motion phase noise existed in electronic components with strong surface sensitivity has been extensively analyzed both from theory and experiments. To select a suitable device with remarkable surface sensitivity is very important for the efficiently research. In this paper, two-port and high Q-value SAW resonators were adopted. The phase noise has been studied from the point of view of stochastic process resulting from gas molecular adsorption and desorption. Experimental results have shown that some organic vapors can reduce the flicker noise (1/f) and random walk(1/f2) noise. Analysis has been made that these effects are not from the e-value increment, but from the changing of dynamic rate of adsorption and desorption. Research on gas motion above the device substrate might explain some phenomenon difficulty explained by the model based only upon substrate itself
  • Keywords
    adsorption; desorption; electron device noise; flicker noise; phase noise; substrates; surface acoustic wave resonators; surface chemistry; dynamic rate of adsorption; dynamic rate of desorption; flicker noise; gas molecular adsorption; gas motion; high Q-value SAW resonators; model; organic vapors; phase noise; random walk(1/f2) noise; stochastic process; surface molecular motion; surface sensitivity; two-port SAW resonators; 1f noise; Circuits; Frequency control; Noise generators; Oscillators; Packaging; Phase noise; Signal generators; Surface acoustic wave devices; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
  • Conference_Location
    Kansas City, MO
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-5838-4
  • Type

    conf

  • DOI
    10.1109/FREQ.2000.887374
  • Filename
    887374