DocumentCode
2678893
Title
Theoretical and experimental studies of loss in piezoelectric ceramic resonators
Author
Pastore, R.A., Jr. ; Ballato, A. ; Kosinski, J.A. ; Cui, H.L.
Author_Institution
US Army Commun. Electron. Command, USA
fYear
2000
fDate
2000
Firstpage
388
Lastpage
392
Abstract
The aim of this work is to explore theoretically and experimentally the behavior of lossy piezoelectric ceramic resonators using PZT as a case study. Acoustic loss is included in the calculations by including acoustic viscosity as the complex component of the elastic stiffness constant. The constitutive relations are the solved for the dispersion relation characterizing the simple thickness modes of plate resonators. The solution has been found to be complex, implying that the device has a complex resonant point. Two equivalent circuit models have been developed to explain this behavior: one approach uses a transmission line model, while the other uses an RLC circuit analog. The simulations have demonstrated that the device looks like an RLC circuit when stimulated by a complex frequency, i.e. an exponentially decaying sine wave. Experimental results are presented which corroborate the theoretical analyses
Keywords
Q-factor; SPICE; crystal resonators; elastic constants; equivalent circuits; internal friction; losses; piezoceramics; vibrations; PSPICE simulation; PZT; PbZrO3TiO3; RLC circuit analog; acoustic loss terms; acoustic viscosity; complex component; complex frequency; constitutive relations; current response; dispersion relation; elastic stiffness constant; equivalent circuit models; exponentially decaying sine wave; lossy resonators; piezoelectric ceramic resonators; plate resonators; simple thickness modes; transmission line model; Acoustic devices; Ceramics; Circuit simulation; Dispersion; Distributed parameter circuits; Equivalent circuits; RLC circuits; Resonance; Transmission line theory; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location
Kansas City, MO
ISSN
1075-6787
Print_ISBN
0-7803-5838-4
Type
conf
DOI
10.1109/FREQ.2000.887386
Filename
887386
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