Title :
A Hierarchical Test Generation Using High Level primitives
Author :
Crestani, D. ; Aguila, A. ; Eudeline, L. ; Gentil, M.-H. ; Durante, C.
Author_Institution :
Universite de Montpelier II : Sciences et Techniques de Languedoc
Keywords :
Arithmetic; Benchmark testing; Circuit faults; Circuit testing; Libraries; Logic arrays; Logic design; Partitioning algorithms; Pins; Robots;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669661
