DocumentCode

2679010

Title

A Hierarchical Test Generation Using High Level primitives

Author

Crestani, D. ; Aguila, A. ; Eudeline, L. ; Gentil, M.-H. ; Durante, C.

Author_Institution

Universite de Montpelier II : Sciences et Techniques de Languedoc

fYear

1993

fDate

3-6 Jan 1993

Firstpage

124

Lastpage

127

Keywords

Arithmetic; Benchmark testing; Circuit faults; Circuit testing; Libraries; Logic arrays; Logic design; Partitioning algorithms; Pins; Robots;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1993. Proceedings. The Sixth International Conference on

ISSN

1063-9667

Print_ISBN

0-8186-3180-5

Type

conf

DOI

10.1109/ICVD.1993.669661

Filename

669661