DocumentCode :
267906
Title :
DOME-DISC: Diffractive optics metrology enabled dithering inertial sensor calibration
Author :
Nadig, Sachin ; Ardanuc, Serhan ; Clark, B. ; Lal, Amit
fYear :
2014
fDate :
26-30 Jan. 2014
Firstpage :
608
Lastpage :
611
Abstract :
We demonstrate 107-ppm accurate scale-factor and bias calibration of a commercial Coriolis force gyroscope, in which the typical un-calibrated scale factor variations are ~100,000-ppm. In this paper, we present a proof-of-concept result on calibration architecture - Diffractive Optics Metrology Enabled Dithering Inertial Sensor Calibration (DOME-DISC). DOME-DISC consists of a piezoelectric dither stage to provide built-in mechanical stimulus to the gyroscope attached to it. The motion of the dithering stage is measured by imaging an optical diffraction pattern created by an incident laser off diffraction gratings on the dither stage. In order to calibrate the gyroscope, the stage motion needs to be measured accurately and precisely. The motion of the stage is measured using the Nano Optical Ruler Imaging System (NORIS), with absolute accuracy of ~30nm over several millimeters, stable over several hours. NORIS provides parts-per-million stage motion measurement accuracy. In this paper, an angular dither motion of 0.1 to 0.5 degrees was optically measured with ~ 0.1 millidegree resolution. By measuring the scale factor and bias for a gyroscope on the dither stage mounted directly on a commercial rate table, and matching the gyroscope input-output curve to 100ppm, we demonstrate the capability to measure in-package gyroscope characteristics within the error limits of the commercial rate table.
Keywords :
Coriolis force; calibration; diffraction gratings; gyroscopes; image sensors; integrated optics; integrated optoelectronics; light diffraction; motion measurement; nanophotonics; nanosensors; optical images; optical sensors; piezoelectric devices; DOME-DISC; NORIS; bias calibration; built-in mechanical stimulus; commercial Coriolis force gyroscope; diffractive optics metrology enabled dithering inertial sensor calibration; incident laser off diffraction gratings; motion measurement; nanooptical ruler imaging system; optical diffraction pattern; piezoelectric dither stage; scale factor variations; Accuracy; Calibration; Diffraction; Gyroscopes; Metrology; Motion measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1109/MEMSYS.2014.6765714
Filename :
6765714
Link To Document :
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