DocumentCode
2679136
Title
Local stiffness measurements of C. elegans by buckling nanoprobes inside an Environmental SEM
Author
Nakajima, Masahiro ; Ahmad, Mohd Ridzuan ; Kojima, Seiji ; Homma, Michio ; Fukuda, Toshio
Author_Institution
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
fYear
2009
fDate
10-15 Oct. 2009
Firstpage
4695
Lastpage
4700
Abstract
This paper presents the local stiffness measurements of Caenorhabditis Elegans (C. elegans) by buckling nanoprobes through the nanorobotic manipulation system inside an environmental-scanning electron microscope (E-SEM). C. elegans has complex outer and inner structures constructed by approximately one thousand cells. For example, the lateral alae are the surface fine structure by seam cell body. In this paper, their fine structures were observed by E-SEM directly; without any drying or dyeing processes. The observation environments are controlled under different E-SEM chamber pressures for clear observation of C. elegans. The local stiffness of C. elegans was measured by buckling measurement method of the nanoprobe fabricated by focus ion beam (FIB) etching at the tip of atomic force microscope (AFM) cantilever. The measurement position can arbitrarily be controlled by the nanorobotic manipulator inside the E-SEM. In this work, from experimental results, the measured elasticity on lateral alae was 1.6 times larger than it around lateral alae. This local stiffness measurement technique can readily be applied to reveal unknown biological local stiffness, cell health conditions and novel cell diagnosis.
Keywords
atomic force microscopy; biology; buckling; cantilevers; cellular biophysics; elasticity; micromanipulators; probes; scanning electron microscopes; Caenorhabditis Elegans; atomic force microscope cantilever; buckling measurement method; buckling nanoprobes; cell diagnosis; cell health conditions; elasticity measurement; environmental-scanning electron microscope; focus ion beam etching; local stiffness measurements; nanorobotic manipulation system; unknown biological local stiffness; Atomic force microscopy; Atomic measurements; Cells (biology); Electron microscopy; Etching; Force measurement; Ion beams; Nanobioscience; Pressure control; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Robots and Systems, 2009. IROS 2009. IEEE/RSJ International Conference on
Conference_Location
St. Louis, MO
Print_ISBN
978-1-4244-3803-7
Electronic_ISBN
978-1-4244-3804-4
Type
conf
DOI
10.1109/IROS.2009.5354091
Filename
5354091
Link To Document