Title :
Cryo-cooled sapphire oscillator operating above 35 K
Author :
Dick, G. John ; Wang, Rabi T.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We present preliminary design features for a second generation thermomechanically compensated sapphire resonator. Developed a few years ago, the “77 K CSO” resonator showed a quality factor Q=2×106 at an operating temperature of 85 K, enabling a frequency stability of δf/f<1×10-13. The new design promises a frequency stability of parts in 1015 with cooling provided by a cryocooler consuming several hundred watts or less. Optimization of the resonator design for a temperature of 40 K results in a mechanical tuning rate requirement (MHz/micron) reduced by a factor of 8, allowing for reduced EM fields at the surface of the sapphire and reduced sensitivity to mechanical deformation. This optimized EM design is implemented in a self-assembling mechanical design that allows easy disassembly for cleaning, together with a first-order cancellation for expected mechanisms of physical creep. The new design is expected to share the very short thermal time constants characteristic of the 10 K and 77 K CSO resonators, thus allowing effective compensation of rapid temperature fluctuations
Keywords :
Q-factor; cryogenics; crystal oscillators; frequency stability; sapphire; 40 K; Al2O3; EM fields; cryo-cooled sapphire oscillator; frequency stability; mechanical deformation; mechanical tuning rate requirement; operating temperature; physical creep; quality factor; rapid temperature fluctuations; resonator design; self-assembling mechanical design; thermal time constants; thermomechanically compensated sapphire resonator; Cleaning; Cooling; Design optimization; Frequency; Oscillators; Q factor; Stability; Temperature sensors; Thermomechanical processes; Tuning;
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
Print_ISBN :
0-7803-5838-4
DOI :
10.1109/FREQ.2000.887404