Title :
Efficient analytical macromodeling of large analog circuits by Transfer Function Trajectories
Author :
De Jonghe, Dimitri ; Gielen, Georges
Author_Institution :
ESAT-MICAS, K.U. Leuven, Heverlee, Belgium
Abstract :
Automated abstraction of large analog circuits greatly improves simulation time in custom analog design flows. Due to the high degree of variety of circuits this task is mainly a manual ad-hoc approach. This paper proposes an automated modeling approach for large scale analog circuits that produces compact expressions from a SPICE netlist. The presented method builds upon the state-of-the-art Trajectory PieceWise (TPW) approach. Because of their data-driven nature, TPW implementations generate models that require on-the-fly database interpolation during simulation, which is not embedded in a standard commercial design flow. Our approach solves this by recombining TPW samples as a surface in a mixed state space-frequency domain, revealing information about the circuit´s nonlinear behavior. The resulting data, termed Transfer Function Trajectories (TFT), is fitted with a parametric vector fitting algorithm and further translated to system blocks. These are compatible with VHDL-AMS/Verilog-AMS, Matlab/Simulink or hand calculations at all design stages. The models show high accuracy and a speedup of 10×-40× against the ELDO simulator for large circuits up to 150 nodes.
Keywords :
analogue circuits; frequency-domain analysis; interpolation; transfer functions; ELDO simulator; Matlab-Simulink; SPICE netlist; VHDL-AMS-Verilog-AMS; automated modeling approach; circuit nonlinear behavior; custom analog design flows; large analog circuit analytical macromodeling; manual ad-hoc approach; mixed state space-frequency domain; on-the-fly database interpolation; trajectory piecewise approach; transfer function trajectory; Analog circuits; Integrated circuit modeling; Solid modeling; Thin film transistors; Trajectory; Transfer functions; Vectors;
Conference_Titel :
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4577-1399-6
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2011.6105311