Title :
Remanence Enhancement And Exchange Coupling In PrCo/Co Films
Author :
Liu, J.P. ; Shan, Z.S. ; Sellmyer, D.J.
Author_Institution :
University of Nebraska
Keywords :
Atomic layer deposition; Chromium; Coercive force; Laboratories; Magnetic films; Magnetic multilayers; Remanence; Saturation magnetization; US Department of Energy; USA Councils;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597897