Title :
Extraction of surface currents of solitary internal waves from synthetic aperture radar data
Author_Institution :
Northwest Res. Associates Inc., Bellevue, WA, USA
Abstract :
Interaction between surface waves and horizontally varying surface currents produce variations in sea surface roughness which can be observed by a synthetic aperture radar (SAR). An inversion model is developed to extract surface currents from SAR images. This data inversion is based on iterative fitting of observed SAR data to forward models of wave-current interaction, radar scattering, and SAR imaging. The inversion model is applied to SAR measurements of solitary internal waves in the New York Bight during the SAR Internal Wave Signature Experiment (SARSEX) (Gasparovic et al., 1988). The surface currents of internal waves thus extracted are compared with in-situ measurements. A spaceborne SAR can provide all-weather, day-night imagery of the ocean with a swath of ~50 km and a spatial resolution of <20 m. The ability to extract accurate surface currents from SAR images provides a cost-effective means for obtaining surface current measurements over a wide area. This technique is especially useful when areas are imaged frequently by the sensor, such as about once a day for NASA´s Lightweight SAR (LightSAR) currently in the planning stage
Keywords :
ocean waves; oceanographic regions; oceanographic techniques; radar imaging; remote sensing by radar; spaceborne radar; synthetic aperture radar; New York Bight; North Atlantic; SAR; SAR image; SAR imaging; SARSEX; dynamics; internal wave; inversion model; iterative fitting; measurement technique; ocean wave; radar remote sensing; radar scattering; roughness; solitary internal wave; spaceborne radar; surface current; synthetic aperture radar; wave-current interaction; Current measurement; Data mining; Rough surfaces; Sea measurements; Sea surface; Sea surface roughness; Surface fitting; Surface roughness; Surface waves; Synthetic aperture radar;
Conference_Titel :
Current Measurement, 1999. Proceedings of the IEEE Sixth Working Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5505-9
DOI :
10.1109/CCM.1999.755208