Title :
A protection circuit for HBT RF Power Amplifier under load mismatch conditions
Author :
Karoui, Walid ; Parra, Thierry
Author_Institution :
Freescale Semicond., Toulouse
Abstract :
This paper investigates the radiofrequency failure mechanisms of power amplifier (PA) integrated in an HBT technology, and proposes a circuit solution for PA protection against impedance mismatches. It exposes the failure mechanisms that occur when a PA under extreme conditions (high battery voltage and high input power) is exposed to impedance mismatches at its output. Protection against high voltage operation is addressed by integrating a parallel base resistor which increases significantly emitter collector breakdown. A current sensor is then associated to a feedback loop on the PA biasing circuit that operates when the PA is in high dissipated power conditions by limiting the collector current. These protections are easily implemented on the PA die without any extra area. Experiments confirm the effectiveness of these principles: the protection is indexed on the collector supply voltage and acts for all output loads leading to VSWR up to 1 0:1, whereas output power and power efficiency on a 50 Omega load are not affected.
Keywords :
bipolar transistor circuits; heterojunction bipolar transistors; power amplifiers; radiofrequency amplifiers; HBT RF power amplifier; PA protection; current sensor; emitter collector breakdown; impedance mismatch; load mismatch conditions; parallel base resistor; protection circuit; radiofrequency failure mechanism; Batteries; Breakdown voltage; Failure analysis; Heterojunction bipolar transistors; Impedance; Integrated circuit technology; Power amplifiers; Protection; Radio frequency; Radiofrequency amplifiers;
Conference_Titel :
Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2331-6
Electronic_ISBN :
978-1-4244-2332-3
DOI :
10.1109/NEWCAS.2008.4606366