DocumentCode :
2679702
Title :
Microwave frequency reference based on VCSEL-driven dark-line resonances in Cs vapor
Author :
Kitching, J. ; Vukicevic, N. ; Hollberg, L. ; Knappe, Svenja ; Affolderbach, Christoph ; Wynands, R.
Author_Institution :
Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO
fYear :
2000
fDate :
2000
Firstpage :
687
Lastpage :
693
Abstract :
Dark-line resonances in Cs vapor are studied for potential use in a compact, low-power microwave frequency reference. The resonance is excited using light from a VCSEL and detected using the change in DC absorption, resulting in an extremely simple physics package with very high tolerance to misalignment and potentially low acceleration sensitivity. We anticipate engineering the package developed into a device with a volume less than 1 cm×1 cm×2 cm and a power dissipation of much less than 100 mW, depending on the thermal environment
Keywords :
atomic clocks; caesium; frequency stability; frequency standards; hyperfine structure; microwave measurement; resonant states; surface emitting lasers; Cs; DC absorption change; FM-AM noise conversion; VCSEL-driven dark-line resonances; caesium vapor; compact low-power frequency reference; hyperfine levels; low acceleration sensitivity; microwave frequency reference; three-level lambda-configuration; Acceleration; Electromagnetic wave absorption; Microwave frequencies; Packaging; Physics; Power dissipation; Power engineering and energy; Resonance; Thermal engineering; Vertical cavity surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
ISSN :
1075-6787
Print_ISBN :
0-7803-5838-4
Type :
conf
DOI :
10.1109/FREQ.2000.887438
Filename :
887438
Link To Document :
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