Microwave frequency reference based on VCSEL-driven dark-line resonances in Cs vapor

Author

Kitching, J. ; Vukicevic, N. ; Hollberg, L. ; Knappe, Svenja ; Affolderbach, Christoph ; Wynands, R.

Author_Institution

Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO

fYear

2000

fDate

2000

Firstpage

687

Lastpage

693

Abstract

Dark-line resonances in Cs vapor are studied for potential use in a compact, low-power microwave frequency reference. The resonance is excited using light from a VCSEL and detected using the change in DC absorption, resulting in an extremely simple physics package with very high tolerance to misalignment and potentially low acceleration sensitivity. We anticipate engineering the package developed into a device with a volume less than 1 cm×1 cm×2 cm and a power dissipation of much less than 100 mW, depending on the thermal environment

Keywords

atomic clocks; caesium; frequency stability; frequency standards; hyperfine structure; microwave measurement; resonant states; surface emitting lasers; Cs; DC absorption change; FM-AM noise conversion; VCSEL-driven dark-line resonances; caesium vapor; compact low-power frequency reference; hyperfine levels; low acceleration sensitivity; microwave frequency reference; three-level lambda-configuration; Acceleration; Electromagnetic wave absorption; Microwave frequencies; Packaging; Physics; Power dissipation; Power engineering and energy; Resonance; Thermal engineering; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International

Conference_Location

Kansas City, MO

ISSN

1075-6787

Print_ISBN

0-7803-5838-4

Type

conf

DOI

10.1109/FREQ.2000.887438

Filename

887438