Title :
Conformal copper deposition in deep trenches
Author :
Bollmann, D. ; Merkel, R. ; Klumpp, A.
Author_Institution :
Institut fur Festkopertechnologie
Keywords :
Chemical vapor deposition; Conductivity; Copper; Filling; Integrated circuit interconnections; Integrated circuit technology; Metallization; Substrates; Temperature; Very large scale integration;
Conference_Titel :
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location :
Villard de Lans, France
DOI :
10.1109/MAM.1998.887497