Title :
Effect of BJT’s parasitics on computing cells for analog decoders
Author :
Duchaux, Nicolas ; Lahuec, Cyril ; Seguin, Fabrice ; Arzel, Matthieu ; Jézéquel, Michel
Author_Institution :
Dept. Electron., TELECOM BRETAGNE, Brest
Abstract :
This paper analyzes the effect of inherent bipolar transistor parasitic elements on the computing nodes performance used in BJT analog decoders. It is shown that these undesirable effects significantly degrade, up to 85%, the conversion of Log-Likelihood Ratios into probabilities. This can lead to a wrong decoding outcome when complex computing nodes are designed. Simulation results are shown for a 0.25-mum BiCMOS process from NXP.
Keywords :
BiCMOS analogue integrated circuits; analogue multipliers; bipolar transistors; decoding; probability; BJT parasitics; BiCMOS process; Gilbert multiplier; NXP; analog decoders; bipolar transistor parasitic elements; computing cells; log-likelihood ratio; size 0.25 mum; AWGN; Analog computers; Binary codes; Bit error rate; Computational modeling; Decoding; Degradation; Integrated circuit modeling; Telecommunication computing; Voltage;
Conference_Titel :
Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2331-6
Electronic_ISBN :
978-1-4244-2332-3
DOI :
10.1109/NEWCAS.2008.4606381
