DocumentCode
2679923
Title
Effect of BJT’s parasitics on computing cells for analog decoders
Author
Duchaux, Nicolas ; Lahuec, Cyril ; Seguin, Fabrice ; Arzel, Matthieu ; Jézéquel, Michel
Author_Institution
Dept. Electron., TELECOM BRETAGNE, Brest
fYear
2008
fDate
22-25 June 2008
Firstpage
301
Lastpage
304
Abstract
This paper analyzes the effect of inherent bipolar transistor parasitic elements on the computing nodes performance used in BJT analog decoders. It is shown that these undesirable effects significantly degrade, up to 85%, the conversion of Log-Likelihood Ratios into probabilities. This can lead to a wrong decoding outcome when complex computing nodes are designed. Simulation results are shown for a 0.25-mum BiCMOS process from NXP.
Keywords
BiCMOS analogue integrated circuits; analogue multipliers; bipolar transistors; decoding; probability; BJT parasitics; BiCMOS process; Gilbert multiplier; NXP; analog decoders; bipolar transistor parasitic elements; computing cells; log-likelihood ratio; size 0.25 mum; AWGN; Analog computers; Binary codes; Bit error rate; Computational modeling; Decoding; Degradation; Integrated circuit modeling; Telecommunication computing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on
Conference_Location
Montreal, QC
Print_ISBN
978-1-4244-2331-6
Electronic_ISBN
978-1-4244-2332-3
Type
conf
DOI
10.1109/NEWCAS.2008.4606381
Filename
4606381
Link To Document