• DocumentCode
    2679955
  • Title

    The STeTSiMS STT-RAM simulation and modeling system

  • Author

    Smullen, Clinton W., IV ; Nigam, Anurag ; Gurumurthi, Sudhanva ; Stan, Mircea R.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    318
  • Lastpage
    325
  • Abstract
    There is growing interest in emerging non-volatile memory technologies such as Phase-Change Memory, Memristors, and Spin-Transfer Torque RAM (STT-RAM). STT-RAM, in particular, is experiencing rapid development that can be difficult for memory systems researchers to take advantage of. What is needed are techniques that enable designers to explore the potential of recent STT-RAM designs and adjust the performance without needing a detailed understanding of the physics. In this paper, we present the STeTSiMS STT-RAM Simulation and Modeling System to assist memory systems researchers. After providing background on the operation of STT-RAM magnetic tunnel junctions (MTJs), we demonstrate how to fit three different published MTJ models to our model and normalize their characteristics with respect to common metrics. The high-speed switching behavior of the designs is evaluated using macromagnetic simulations. We have also added a first-order model for STT-RAM memory arrays to the CACTI memory modeling tool, which we then use to evaluate the performance, energy consumption, and area for: (i) a high-performance cache, (ii) a high-capacity cache, and (iii) a high-density memory.
  • Keywords
    cache storage; magnetic tunnelling; memristors; phase change memories; CACTI memory modeling; STT-RAM memory arrays; STeTSiMS; energy consumption; high-capacity cache; high-density memory; high-performance cache; high-speed switching; macromagnetic simulations; magnetic tunnel junctions; memristors; nonvolatile memory; phase-change memory; spin-transfer torque RAM; Anisotropic magnetoresistance; Magnetic tunneling; Mathematical model; Random access memory; Switches; Torque; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105348
  • Filename
    6105348