Title :
Miniaturised Prandtl tube with integrated pressure sensors for micro-thruster plume characterisation
Author :
Dijkstra, Marcel ; Ma, Kwan-Liu ; de Boer, M.J. ; Groenesteijn, J. ; Lotters, J.C. ; Wiegerink, R.J.
Author_Institution :
MESA+ Inst. for Nanotechnol., Univ. of Twente, Enschede, Netherlands
Abstract :
A miniaturised Prandtl-tube sensor incorporating a 6 mm long 40 μm diameter microchannel with integrated pressure sensors has been realised. The sensor has been designed for the characterisation of rarefied plume flow from a MEMS-based monopropellant propulsion system for high-accuracy attitude control of satellites. The 4.5 × 2.5 mm sensor chip incorporates 400 mbar full-scale capacitive pressure sensors. The capacitive pressure transducer is created by merging several microchannels into a rectangular pressure membrane, with outward-facing comb-fingers hinging on the microchannel sidewall. Additionally, thermistors can measure the temperature profile on the Prandtl tube and an integrated Pirani sensor can optionally measure vacuum pressures below 10 mbar. An electronics board and stainless steel probe, from which only the Prandtl tube protrudes has been realised. Initial plume measurements of dynamic pressure on the Prandtl tube have been obtained by flowing air from a metal tube with 0.7 mm diameter, demonstrating the feasibility of the miniaturised Prandtl-tube sensor.
Keywords :
capacitive sensors; microsensors; pressure sensors; pressure transducers; thermistors; MEMS-based monopropellant propulsion system; capacitive pressure sensors; capacitive pressure transducer; electronics board; integrated Pirani sensor; integrated pressure sensors; microchannel sidewall; microthruster plume; miniaturised Prandtl tube; outward facing comb fingers; rarefied plume flow; rectangular pressure membrane; sensor chip; stainless steel probe; thermistors; vacuum pressures; Capacitive sensors; Electron tubes; Microchannel; Pressure measurement; Semiconductor device measurement; Sensor phenomena and characterization;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2014 IEEE 27th International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/MEMSYS.2014.6765812