DocumentCode :
2680096
Title :
Accuracy improvement of two-photon absorption based measurement by temperature controlled Si-photodetector
Author :
Imoto, Soichm ; Sako, Nkya ; Tanaka, Yosuke ; Kurokawa, Takashi
Author_Institution :
Tokyo Univ. of Agric. & Technol., Japan
Volume :
2
fYear :
2003
fDate :
15-19 Dec. 2003
Abstract :
The temperature characteristics of two-photon absorption (TPA) in Si-APD was investigated. Based on this result, we improved the measurement accuracy more than 10 times by the temperature control of Si-APD comparing to the measurement without control.
Keywords :
elemental semiconductors; measurement errors; photodetectors; silicon; temperature control; two-photon processes; Si; Si-photodetector; measurement accuracy; temperature characteristics; temperature control; two-photon absorption; Absorption; Optical fiber sensors; Optimized production technology; Photoconductivity; Proposals; Research and development; Research and development management; Signal to noise ratio; Silicon; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
Type :
conf
DOI :
10.1109/CLEOPR.2003.1276952
Filename :
1276952
Link To Document :
بازگشت