DocumentCode
2680096
Title
Accuracy improvement of two-photon absorption based measurement by temperature controlled Si-photodetector
Author
Imoto, Soichm ; Sako, Nkya ; Tanaka, Yosuke ; Kurokawa, Takashi
Author_Institution
Tokyo Univ. of Agric. & Technol., Japan
Volume
2
fYear
2003
fDate
15-19 Dec. 2003
Abstract
The temperature characteristics of two-photon absorption (TPA) in Si-APD was investigated. Based on this result, we improved the measurement accuracy more than 10 times by the temperature control of Si-APD comparing to the measurement without control.
Keywords
elemental semiconductors; measurement errors; photodetectors; silicon; temperature control; two-photon processes; Si; Si-photodetector; measurement accuracy; temperature characteristics; temperature control; two-photon absorption; Absorption; Optical fiber sensors; Optimized production technology; Photoconductivity; Proposals; Research and development; Research and development management; Signal to noise ratio; Silicon; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN
0-7803-7766-4
Type
conf
DOI
10.1109/CLEOPR.2003.1276952
Filename
1276952
Link To Document