Title :
Self-test For F.I.R. Filters
Author :
Counil, C. ; Renovell, M. ; Cambon, G.
Author_Institution :
Universite Montpelier
Keywords :
Built-in self-test; Circuit testing; Digital filters; Filtering; Finite impulse response filter; Impulse testing; Maximum likelihood detection; Nonlinear filters; Registers; Robots;
Conference_Titel :
VLSI Signal Processing, V, 1992., [Workshop on]
Print_ISBN :
0-7803-0811-5
DOI :
10.1109/VLSISP.1992.639172
