• DocumentCode
    2680189
  • Title

    Application of a surrogate layer for lower bending stress in a tri-material body

  • Author

    Suhir, Ephraim ; Weld, John D.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1996
  • fDate
    28-31 May 1996
  • Firstpage
    435
  • Lastpage
    439
  • Abstract
    Low strength materials in multi-layer (multi-body) structures subjected to a change in temperature often fail because of the elevated thermal expansion (contraction) mismatch of the materials and the resulting curvatures and bending stresses. In some cases, an introduction of an additional `surrogate´ layer of a high expansion and/or high modulus material (not needed from the standpoint of the normal design and operation of the system) can be an effective means to flatten the composite structure and thereby reduce the bending stress in the vulnerable material. Particularly, this approach can be applied to ball grid array (BGA) packages in which an epoxy molding compound encapsulating IC devices on a thin substrate could be prone to cracking as a result of excessive bending at room temperature. We considered the use of an epoxy molding compound on a thin ceramic substrate and suggest that an additional `surrogate´ layer of a high expansion and high modulus polymeric material be applied onto the outer side of the substrate and that this material be processed concurrently with the molding operation. A simple formula is obtained for choosing the thickness of this layer for the given mechanical properties of the material(s), including the additional material itself
  • Keywords
    bending; encapsulation; integrated circuit packaging; stress analysis; thermal expansion; IC devices; ball grid array packages; bending stress; bending stresses; encapsulation; epoxy molding compound; mechanical properties; molding operation; multi-body structures; multi-layer structures; outer side; surrogate layer; thermal expansion mismatch; tri-material body; Ceramics; Compressive stress; Electronic packaging thermal management; Electronics packaging; Plastic packaging; Surface cracks; Temperature; Thermal expansion; Thermal stresses; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1996. Proceedings., 46th
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3286-5
  • Type

    conf

  • DOI
    10.1109/ECTC.1996.517423
  • Filename
    517423