Title :
A New Measurement Method of the Noise Parameters of Two-Port Devices.
fDate :
May 31 1983-June 3 1983
Abstract :
A new procedure, based on the representation of the noise properties of linear two-ports with uncorrelated noise waves, allows the experimental evaluation of the four noise parameters using only a sliding short as tunable element. Experimental set-up and results obtained from measurements of FET devices are discussed.
Keywords :
Circuit noise; FETs; Frequency measurement; Impedance; Noise figure; Noise generators; Noise measurement; Optimized production technology; Scattering parameters; Tunable circuits and devices;
Conference_Titel :
Microwave Symposium Digest, 1983 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
DOI :
10.1109/MWSYM.1983.1130914
