• DocumentCode
    2680331
  • Title

    Defect-tolerant logic implementation onto nanocrossbars by exploiting mapping and morphing simultaneously

  • Author

    Su, Yehua ; Rao, Wenjing

  • Author_Institution
    ECE Dept., Univ. of Illinois at Chicago, Chicago, IL, USA
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    456
  • Lastpage
    462
  • Abstract
    Crossbar-based architectures are promising for the future nanoelectronic systems. However, due to the inherent unreliability, defect tolerance schemes are necessary to guarantee the successful implementations of any logic functions. Most of the existing approaches have been based on logic mapping, which exploits the freedom of choosing which variables/products (in a logic function) to map to which of the vertical/horizontal wires (in a crossbar). In this paper, we propose a new defect tolerance approach, namely logic morphing, by exploiting the various equivalent forms of a logic function. This approach explores a new dimension of freedom in achieving defect tolerance, and is compatible with the existing mapping-based approaches. We propose an integrated algorithmic framework, which employs both mapping and morphing simultaneously, and efficiently searches for a successful logic implementation in the combined solution space. Simulation results show that the proposed scheme boosts defect tolerance capability significantly with many-fold yield improvement, while having no extra runtime over the existing approach of performing mapping alone.
  • Keywords
    logic circuits; nanoelectronics; crossbar-based architectures; defect-tolerant logic function scheme; integrated algorithmic framework; logic mapping approach; logic morphing; nanocrossbars; nanoelectronic systems; vertical-horizontal wires; Fabrication; Logic functions; Nanoscale devices; Programmable logic arrays; Runtime; Switches; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105368
  • Filename
    6105368