• DocumentCode
    2680419
  • Title

    Formation of ultra-thin PtSi layers with a 2-step silicidation process

  • Author

    Donaton, R.A. ; Jin, S. ; Bender, H. ; Maex, K. ; Vantomme, A. ; Langouche, G.

  • Author_Institution
    IMEC
  • fYear
    1997
  • fDate
    16-19 March 1997
  • Firstpage
    118
  • Lastpage
    119
  • Keywords
    Atomic force microscopy; Inorganic materials; Metallization; Silicidation; Silicides; Silicon; Sputter etching; Sputtering; Thickness control; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
  • Conference_Location
    Villard de Lans, France
  • ISSN
    1266-0167
  • Type

    conf

  • DOI
    10.1109/MAM.1998.887534
  • Filename
    887534