• DocumentCode
    2680672
  • Title

    Vectorless verification of RLC power grids with transient current constraints

  • Author

    Xiong, Xuanxing ; Wang, Jia

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    548
  • Lastpage
    554
  • Abstract
    Vectorless power grid verification is a powerful method that evaluates worst-case voltage noises without detailed current waveforms using optimization techniques. It is extremely challenging when considering RLC power grids since inductors are difficult to tackle and multiple time steps should be evaluated after the discretization of the system equation. In this paper, we study integrated RLC power grids with both VDD and GND networks and rigorously prove that their vectorless verification can be decomposed into two sub-problems - the well-studied transient power grid analysis problem and an optimization problem that maximizes an affine function of currents under current constraints. We further introduce transient constraints to restrict the waveform of each current source for realistic scenarios and design the RLCVN algorithm to solve the vectorless verification problem of RLC power grids. Results confirm that our algorithm is an effective approach for practical RLC power grid verification, and the proposed transient constraints make the noise estimations more realistic.
  • Keywords
    RLC circuits; circuit noise; circuit optimisation; power grids; transient analysis; GND networks; RLC power grid vectorless verification; RLCVN algorithm; VDD networks; optimization techniques; transient current constraints; transient power grid analysis problem; voltage noises; Algorithm design and analysis; Equations; Mathematical model; Noise; Power grids; Transient analysis; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105384
  • Filename
    6105384