• DocumentCode
    2680767
  • Title

    Debugging with dominance: On-the-fly RTL debug solution implications

  • Author

    Mangassarian, Hratch ; Veneris, Andreas ; Smith, Duncan Exon ; Safarpour, Sean

  • Author_Institution
    ECE Dept., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    587
  • Lastpage
    594
  • Abstract
    Design debugging has become a resource-intensive bottleneck in modern VLSI CAD flows, consuming as much as 60% of the total verification effort. With typical design sizes exceeding the half-million synthesized gates mark, the growing number of blocks to be examined dramatically slows down the debugging process. The aim of this work is to prune the number of debugging iterations for finding all potential bugs, without affecting the debugging resolution. This is achieved by using structural dominance relationships between circuit components. More specifically, an iterative fixpoint algorithm is presented for finding dominance relationships between multiple-output blocks of the design. These relationships are then leveraged for the early discovery of potential bugs, along with their corrections, resulting in significant debugging speed-ups. Extensive experiments on real industrial designs show that 66% of solutions are discovered early due to dominator implications. This results in consistent performance gains in all cases and a 1.7× overall speed-up for finding all potential bugs, demonstrating the robustness and practicality of the proposed approach.
  • Keywords
    CAD; VLSI; electronic engineering computing; iterative methods; VLSI CAD flows; circuit components; design debugging; iterative fixpoint algorithm; on-the-fly RTL debug solution implications; resource-intensive bottleneck; structural dominance relationships;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105390
  • Filename
    6105390