• DocumentCode
    2680808
  • Title

    Toward an extremely-high-throughput and even-distribution pattern generator for the constrained random simulation techniques

  • Author

    Bo-Han Wu ; Chun-Ju Yang ; Chia-Cheng Tso ; Chung-Yang Huang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    7-10 Nov. 2011
  • Firstpage
    602
  • Lastpage
    607
  • Abstract
    Constrained random simulation is becoming the mainstream methodology in functional verification. In order to achieve the verification closure, a high-throughput and evenly-distributed constrained random pattern generator has become a must. In this paper, we propose a novel Range-Splitting heuristic and a Solution-Density Estimation technique (RSSDE) to partition sample space. The chosen cutting planes target to prune more infeasible subspaces so that the solution densities in other subspaces increase correspondingly. In addition, with statistics-based analyses, the estimated solution densities precisely predict the distribution of solutions. The intermediate statistical information is recorded in a range-splitting tree (RS-tree). By top-down random walking on the RS-tree, random pattern generation produces evenly-distributed patterns with high throughput. Experimental results show that our framework guarantees evenly-distributed stimuli and achieves more than 10× speedup in average when compared to a state-of-the-art commercial generator.
  • Keywords
    digital simulation; formal verification; random number generation; statistics; trees (mathematics); constrained random simulation techniques; evenly-distributed constrained random pattern generator; extremely-high-throughput; functional verification; range-splitting heuristic; range-splitting tree; solution-density estimation technique; statistics-based analysis; top-down random walking; Complexity theory; Data structures; Engines; Estimation; Generators; Runtime; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4577-1399-6
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • DOI
    10.1109/ICCAD.2011.6105392
  • Filename
    6105392