DocumentCode
2680808
Title
Toward an extremely-high-throughput and even-distribution pattern generator for the constrained random simulation techniques
Author
Bo-Han Wu ; Chun-Ju Yang ; Chia-Cheng Tso ; Chung-Yang Huang
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2011
fDate
7-10 Nov. 2011
Firstpage
602
Lastpage
607
Abstract
Constrained random simulation is becoming the mainstream methodology in functional verification. In order to achieve the verification closure, a high-throughput and evenly-distributed constrained random pattern generator has become a must. In this paper, we propose a novel Range-Splitting heuristic and a Solution-Density Estimation technique (RSSDE) to partition sample space. The chosen cutting planes target to prune more infeasible subspaces so that the solution densities in other subspaces increase correspondingly. In addition, with statistics-based analyses, the estimated solution densities precisely predict the distribution of solutions. The intermediate statistical information is recorded in a range-splitting tree (RS-tree). By top-down random walking on the RS-tree, random pattern generation produces evenly-distributed patterns with high throughput. Experimental results show that our framework guarantees evenly-distributed stimuli and achieves more than 10× speedup in average when compared to a state-of-the-art commercial generator.
Keywords
digital simulation; formal verification; random number generation; statistics; trees (mathematics); constrained random simulation techniques; evenly-distributed constrained random pattern generator; extremely-high-throughput; functional verification; range-splitting heuristic; range-splitting tree; solution-density estimation technique; statistics-based analysis; top-down random walking; Complexity theory; Data structures; Engines; Estimation; Generators; Runtime; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2011 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4577-1399-6
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2011.6105392
Filename
6105392
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