DocumentCode :
2680897
Title :
Local nucleation and lateral crystallisation of the silicide phases in CoSi2 buffer layer of YBCO/CoSi2/Si structure
Author :
Belousov, I. ; Rudenko, E. ; Linzen, S. ; Seidel, P.
Author_Institution :
Ukrainian National Academy of Sciences
fYear :
1997
fDate :
16-19 March 1997
Firstpage :
185
Lastpage :
188
Keywords :
Annealing; Buffer layers; Crystallization; Grain boundaries; Inorganic materials; Rough surfaces; Semiconductor films; Silicides; Surface roughness; Yttrium barium copper oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location :
Villard de Lans, France
ISSN :
1266-0167
Type :
conf
DOI :
10.1109/MAM.1998.887568
Filename :
887568
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2680897
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